Itocazu, V.T.V.T.ItocazuSonnenberg, V.V.SonnenbergSimoen, EddyEddySimoenClaeys, CorCorClaeysMartino, J.A.J.A.Martino2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20850Analysis of the silicon film thickness and the ground plane influence on ultra thin buried oxide SOI nMOSFETsProceedings paper