Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches

Czarnecki, PiotrPiotrCzarneckiRottenberg, XavierXavierRottenbergPuers, BobBobPuersDe Wolf, IngridIngridDe Wolf2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10276Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switchesProceedings paper