Experimental determination of the apex temperature of a semiconducting tip during laser-assisted atom probe tomography

Kumar, ArulArulKumarDemeulemeester, JelleJelleDemeulemeesterBogdanowicz, JanuszJanuszBogdanowiczBran, JulienJulienBranMelkonyan, DavitDavitMelkonyan2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24080Experimental determination of the apex temperature of a semiconducting tip during laser-assisted atom probe tomographyOral presentation