Brammertz, GuyGuyBrammertzLin, DennisDennisLinMartens, KoenKoenMartensMercier, DavidDavidMercierMerckling, ClementClementMercklingPenaud, JulienJulienPenaudAdelmann, ChristophChristophAdelmannSioncke, SonjaSonjaSionckeWang, Wei-EWei-EWangCaymax, MattyMattyCaymaxMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-172021-10-1720080013-4651https://imec-publications.be/handle/20.500.12860/13444Capacitance-voltage characterization of GaAs-Oxide interfacesJournal articlehttp://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JESOAN00015500001200H945000001&idtype=cvips&gifs=yes