Understanding nMOSFET characteristics after soft breakdown and their dependence on the breakdown location

Kaczer, BenBenKaczerDegraeve, RobinRobinDegraeveCrupi, FeliceFeliceCrupiDe Keersgieter, AnAnDe KeersgieterGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6459Understanding nMOSFET characteristics after soft breakdown and their dependence on the breakdown locationProceedings paper