Cimino, SalvatoreSalvatoreCiminoPantisano, LuigiLuigiPantisanoAoulaiche, MarcMarcAoulaicheDegraeve, RobinRobinDegraeveKwak, Dong HwaDong HwaKwakCrupi, FeliceFeliceCrupiGroeseneken, GuidoGuidoGroesenekenPaccagnella, A.A.Paccagnella2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10230Hot carrier degradation on n-channel SiO2/HfSiO MOSFETs: Effects on the devices performance and lifetimeProceedings paper