Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model

Kukner, HalilHalilKuknerWeckx, PieterPieterWeckxRaghavan, PraveenPraveenRaghavanKaczer, BenBenKaczerCatthoor, FranckyFranckyCatthoorVan der Perre, LiesbetLiesbetVan der PerreLauwereins, RudyRudyLauwereinsGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120130141-9331https://imec-publications.be/handle/20.500.12860/22621Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI modelJournal articlehttp://www.sciencedirect.com/science/article/pii/S0141933113000574