Fleetwood, DanDanFleetwoodBeyne, SofieSofieBeynejiang, RongRongjiangZhao, S. E.S. E.ZhaoWhang, P.P.WhangBonaldo, S.S.BonaldoMcCurdy, M. W.M. W.McCurdyTokei, ZsoltZsoltTokeiDe Wolf, IngridIngridDe WolfCroes, KristofKristofCroesZhang, E. X.E. X.ZhangAlles, M. S.M. S.AllesSchrimpf, RonaldRonaldSchrimpfReed, RobertRobertReedLinten, DimitriDimitriLinten2021-10-272021-10-2720190003-6951https://imec-publications.be/handle/20.500.12860/32968Low-frequency Noise and Defects in Copper and Ruthenium ResistorsJournal articlehttps://doi.org/10.1063/1.5093549