Reliability screening oh high-k dielectrics based on voltage ramp stress

Kerber, A.A.KerberPantisano, LuigiLuigiPantisanoVeloso, AnabelaAnabelaVelosoGroeseneken, GuidoGuidoGroesenekenKerber, M.M.Kerber2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12391Reliability screening oh high-k dielectrics based on voltage ramp stressJournal article