Yuan, SicongSicongYuanTaouil, MottaqiallahMottaqiallahTaouilFieback, MoritzMoritzFiebackXun, HanzhiHanzhiXunMarinissen, Erik JanErik JanMarinissenKar, Gouri SankarGouri SankarKarRao, SiddharthSiddharthRaoCouet, SebastienSebastienCouetHamdioui, SaidSaidHamdioui2024-03-212023-08-192024-03-2120231530-1591WOS:001027444200132https://imec-publications.be/handle/20.500.12860/42354Device-Aware Test for Back-Hopping Defects in STT-MRAMsProceedings paper979-8-3503-9624-9WOS:001027444200132