Van Houdt, JanJanVan HoudtWellekens, DirkDirkWellekensVanhorebeek, GuidoGuidoVanhorebeekHaspeslagh, LucLucHaspeslaghDeferm, LudoLudoDefermGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/947Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arraysProceedings paper