Steering the properties of MoOX hole transporting layers in OPV's and OLED's: Interface morphology vs. electronic structure

Marchal, WouterWouterMarchalVerboven, IngeIngeVerbovenKesters, JurgenJurgenKestersMoeremans, BoazBoazMoeremansDe Dobbelaere, ChristopherChristopherDe DobbelaereBonneux, GillesGillesBonneuxElen, KenKenElenConings, BertBertConingsMaes, WouterWouterMaesBoyen, Hans-GerdHans-GerdBoyenDeferme, WimWimDefermeVan Bael, MarliesMarliesVan BaelHardy, AnAnHardy2021-10-242021-10-2420171996-1944https://imec-publications.be/handle/20.500.12860/28915Steering the properties of MoOX hole transporting layers in OPV's and OLED's: Interface morphology vs. electronic structureJournal article10.3390/ma10020123http://www.mdpi.com/1996-1944/10/2/123