Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures

Asanovski, RubenRubenAsanovskiGrill, AlexanderAlexanderGrillFranco, JacopoJacopoFrancoPalestri, PierpaoloPierpaoloPalestriBeckers, ArnoutArnoutBeckersKaczer, BenBenKaczerSelmi, LucaLucaSelmi2023-07-242023-02-102023-07-2420230018-9383WOS:000915823900001https://imec-publications.be/handle/20.500.12860/41084Understanding the Excess 1/f Noise in MOSFETs at Cryogenic TemperaturesJournal article10.1109/TED.2022.3233551WOS:000915823900001LOW-FREQUENCY NOISEQUANTUMGATE