Rony, M. W.M. W.RonySamsel, Isaak K.Isaak K.SamselZhang, En XiaEn XiaZhangSternberg, AndrewAndrewSternbergLi, KanKanLiReaz, MahmudMahmudReazAustin, Stephanie M.Stephanie M.AustinAlles, Michael L.Michael L.AllesLinten, DimitriDimitriLintenMitard, JeromeJeromeMitardReed, Robert A.Robert A.ReedFleetwood, Daniel M.Daniel M.FleetwoodSchrimpf, Ronald D.Ronald D.Schrimpf2022-03-312021-11-022022-03-312022-03-3120210018-9499WOS:000655537500044https://imec-publications.be/handle/20.500.12860/37950Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETsJournal article10.1109/TNS.2021.3072068WOS:000655537500044HEAVY-IONTRANSIENTSMECHANISMSRADIATIONBULK