Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs

Talmat, R.R.TalmatAchour, H.H.AchourCretu, B.B.CretuRoutoure, J.-M.J.-M.RoutoureBenfdila, A.A.BenfdilaCarin, R.R.CarinCollaert, NadineNadineCollaertMercha, AbdelkarimAbdelkarimMerchaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19864Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETsProceedings paper