Rotondaro, AntonioAntonioRotondaroHurd, TraceTraceHurdKaniava, ArvydasArvydasKaniavaVanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenHeyns, MarcMarcHeynsClaeys, CorCorClaeysBrown, G.G.Brown2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/841The impact of Fe and Cu on the minority carrier lifetime of P and N-type silicon wafersProceedings paper