Wu, ZhichengZhichengWuVaisman Chasin, AdrianAdrianVaisman ChasinFranco, JacopoJacopoFrancoSubhechha, SubhaliSubhaliSubhechhaDekkers, HaroldHaroldDekkersYengula Venkata Ramana, BhuvaneshwariBhuvaneshwariYengula Venkata RamanaBelmonte, AttilioAttilioBelmonteRassoul, NouredineNouredineRassoulvan Setten, MichielMichielvan SettenAfanas'ev, V.V.Afanas'evDelhougne, RomainRomainDelhougneKaczer, BenBenKaczerKar, Gouri SankarGouri SankarKar2023-06-012023-05-252023-06-0120222380-9248WOS:000968800700110https://imec-publications.be/handle/20.500.12860/41624Characterizing and Modelling of the BTI Reliability in IGZO-TFT using Light-assisted I-V SpectroscopyProceedings paper10.1109/IEDM45625.2022.10019454978-1-6654-8959-1WOS:000968800700110