Bennamane, K.K.BennamaneBoutchacha, T.T.BoutchachaGhibaudo, G.G.GhibaudoMouis, M.M.MouisCollaert, NadineNadineCollaert2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/14975Static and low frequency noise characterization of FinFET devicesProceedings paper