A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias

Ji, Z.Z.JiZhang, J.F.J.F.ZhangLin, L.L.LinDuan, M.M.DuanZhang, W.W.ZhangZhang, X.X.ZhangGao, R.R.GaoKaczer, BenBenKaczerFranco, JacopoJacopoFrancoSchram, TomTomSchramHoriguchi, NaotoNaotoHoriguchiDe Gendt, StefanStefanDe GendtGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25430A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-biasProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7223693