Scholz, MirkoMirkoScholzChen, Shih-HungShih-HungChenLinten, DimitriDimitriLintenThijs, StevenStevenThijsSawada, MasanoriMasanoriSawadaJohnsson, DavidDavidJohnssonGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21474Impact of tester source impedance on HBM failure levelProceedings paper