Low-frequency noise behaviour of bulk and DTMOS triple-gate devices under 60 MeV proton irradiation

de Andrade, M.G.C.M.G.C.de AndradeMartino, J.A.J.A.MartinoAoulaiche, MarcMarcAoulaicheCollaert, NadineNadineCollaertSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20526Low-frequency noise behaviour of bulk and DTMOS triple-gate devices under 60 MeV proton irradiationProceedings paper