Nigam, TanyaTanyaNigamDepas, MichelMichelDepasDegraeve, RobinRobinDegraeveHeyns, MarcMarcHeynsGroeseneken, GuidoGuidoGroeseneken2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2056Gate voltage dependence of reliability for ultra-thin oxidesProceedings paper