Investigation and comparison of the noise in the gate and substrate current after soft-breakdown

Crupi, FeliceFeliceCrupiDegraeve, RobinRobinDegraeveGroeseneken, GuidoGuidoGroesenekenNigam, TanyaTanyaNigamMaes, HermanHermanMaes2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3323Investigation and comparison of the noise in the gate and substrate current after soft-breakdownJournal article