Improved and accurate physics-of-failure (PoF) nethodology for qualification and lifetime assessment of electronic systems

Temsamani, A.B.A.B.TemsamaniKauffmann, S.S.KauffmannDescas, Y.Y.DescasVandevelde, BartBartVandeveldeZanon, FrancoFrancoZanonWillems, GeertGeertWillems2021-10-242021-10-2420170026-2714https://imec-publications.be/handle/20.500.12860/29560Improved and accurate physics-of-failure (PoF) nethodology for qualification and lifetime assessment of electronic systemsJournal articlehttps://www.sciencedirect.com/science/article/pii/S0026271417302354