Rolain, YvesYvesRolainVan Moer, W.W.Van MoerVandersteen, GerdGerdVandersteenSchoukens, J.J.Schoukens2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4703Why are non-linear microwave measurements so involved?Proceedings paper