Bender, HugoHugoBenderBenedetti, AlessandroAlessandroBenedettiRichard, OlivierOlivierRichardVan Marcke, PatriciaPatriciaVan MarckeDrijbooms, ChrisChrisDrijbooms2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7194Focused ion beam sample preparation: applications in materials scienceOral presentation