Vandemaele, MichielMichielVandemaeleKaczer, BenBenKaczerTyaginov, StanislavStanislavTyaginovBury, ErikErikBuryVaisman Chasin, AdrianAdrianVaisman ChasinFranco, JacopoJacopoFrancoMakarov, AlexanderAlexanderMakarovMertens, HansHansMertensHellings, GeertGeertHellingsGroeseneken, GuidoGuidoGroeseneken2024-01-162023-02-272023-02-282023-04-192024-01-162022-05-021541-7026WOS:000922926400047https://imec-publications.be/handle/20.500.12860/41171Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETsProceedings paper10.1109/IRPS48227.2022.9764470978-1-6654-7950-9WOS:000922926400047Electrical & electronic engineering