The impact of self-heating and its implications on hot-carrier degradation-A modeling study

Makarov, A.A.MakarovJech, M.M.JechTyaginov, StanislavStanislavTyaginovVaisman Chasin, AdrianAdrianVaisman ChasinBury, ErikErikBuryVandemaele, MichielMichielVandemaeleGrill, AlexanderAlexanderGrillDe Keersgieter, AnAnDe KeersgieterLinten, DimitriDimitriLintenKaczer, BenBenKaczer2021-11-232021-11-022021-11-2320210026-2714WOS:000659230300010https://imec-publications.be/handle/20.500.12860/37869The impact of self-heating and its implications on hot-carrier degradation-A modeling studyJournal article10.1016/j.microrel.2021.114156WOS:000659230300010DISSOCIATION KINETICSGENERATIONDEVICEPASSIVATIONTRANSISTORSSCATTERINGMECHANISMTRANSPORTDEFECTSNMOS