Investigation of preexisting and generated defects in nonfilamentary a-Si/TiO2 RRAM and their impacts on RTN amplitude distribution

Ma, JigangJigangMaChai, ZhengZhengChaiZhang, Wei DongWei DongZhangZhang, J. F.J. F.ZhangJi, Z.Z.JiBenbakhti, BrahimBrahimBenbakhtiGovoreanu, BogdanBogdanGovoreanuSimoen, EddyEddySimoenGoux, LudovicLudovicGouxBelmonte, AttilioAttilioBelmonteDegraeve, RobinRobinDegraeveKar, Gouri SankarGouri SankarKarJurczak, GosiaGosiaJurczak2021-10-252021-10-2520180018-9383https://imec-publications.be/handle/20.500.12860/31252Investigation of preexisting and generated defects in nonfilamentary a-Si/TiO2 RRAM and their impacts on RTN amplitude distributionJournal articlehttps://ieeexplore.ieee.org/document/8276315/