Hubrechtsen, LieseLieseHubrechtsenDe Taeye, LouisLouisDe TaeyeVereecken, PhilippePhilippeVereecken2024-02-262023-10-222024-02-2620242366-9608WOS:001076322900001https://imec-publications.be/handle/20.500.12860/42902Tracking Decomposition Layer Formation in Thin-Film Si Electrodes via Thermogalvanic ProfilesJournal article10.1002/smtd.202300857WOS:001076322900001LITHIUM-ION BATTERIESENTROPY CHANGESILICON ELECTRODESALLOY ANODESINTERCALATIONPERFORMANCELITHIATIONGRAPHITECARBONMEDLINE:37800995