Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontTakami, Y.Y.TakamiHayama, KiyoteruKiyoteruHayamaSunaga, H.H.SunagaNashiyama, I.I.NashiyamaUwatoko, Y.Y.UwatokoPoortmans, JefJefPoortmansCaymax, MattyMattyCaymax2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1387Degradation and recovery of Si1-xGex devices after proton irradiationOral presentation