Correlated time-0 and hot-carrier stress induced FinFET parameter variabilities: modeling approach

Makarov, AlexanderAlexanderMakarovRoussel, PhilippePhilippeRousselBury, ErikErikBuryVandemaele, MichielMichielVandemaeleSpessot, AlessioAlessioSpessotLinten, DimitriDimitriLintenKaczer, BenBenKaczerTyaginov, StanislavStanislavTyaginov2021-10-292021-10-2920202072-666Xhttps://imec-publications.be/handle/20.500.12860/35535Correlated time-0 and hot-carrier stress induced FinFET parameter variabilities: modeling approachJournal articlehttps://doi.org/10.3390/mi11070657