Dark and light-induced bias stress in pentacene field-effect transistors by charge trapping at the organic semiconductor/gate dielectric interface

Debucquoy, MaartenMaartenDebucquoyVerlaak, StijnStijnVerlaakGenoe, JanJanGenoeHeremans, PaulPaulHeremans2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12019Dark and light-induced bias stress in pentacene field-effect transistors by charge trapping at the organic semiconductor/gate dielectric interfaceOral presentation