On the electrical characterization of grain boundaries in multicrytalline silicon

Chen, JiaheJiaheChenCornagliotti, EmanueleEmanueleCornagliottiHieckmann, E.E.HieckmannBerendt, S.S.BerendtWeber, J.J.WeberSimoen, EddyEddySimoenPoortmans, JefJefPoortmans2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18658On the electrical characterization of grain boundaries in multicrytalline siliconProceedings paper