In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

Rampelberg, GeertGeertRampelbergDe Schutter, BobBobDe SchutterDe Vulder, WouterWouterDe VulderMartens, KoenKoenMartensRadu, IulianaIulianaRaduDetavernier, ChristopheChristopheDetavernier2021-10-222021-10-2220152050-7526https://imec-publications.be/handle/20.500.12860/25801In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin filmsJournal articlehttp://pubs.rsc.org/en/Content/ArticleLanding/2015/TC/C5TC02553B#!divAbstract