Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubs

Meynants, GuyGuyMeynantsPoortmans, JefJefPoortmansMertens, RobertRobertMertensPolce, N.N.PolceJones, S.S.JonesBlackstone, S.S.Blackstone2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2022Excess carrier lifetime and surface recombination velocity in dielectrically isolated Si-tubsOral presentation