Deprez, KennethKennethDeprezVerloock, LeenLeenVerloockColussi, LoekLoekColussiAerts, SamSamAertsVan den Bossche, Matthias 2Matthias 2Van den BosscheKamer, JosJosKamerBolte, JohnJohnBolteMartens, LucLucMartensPlets, DavidDavidPletsJoseph, WoutWoutJoseph2024-01-222023-03-242024-01-222022N/Ahttps://imec-publications.be/handle/20.500.12860/41358Comparison of assessment methods for in-situ 5G NR base station exposureProceedings paperElectrical & electronic engineering