Houssa, MichelMichelHoussaDe Gendt, StefanStefanDe GendtAutran, J.L.J.L.AutranGroeseneken, GuidoGuidoGroesenekenHeyns, MarcMarcHeyns2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9063Detrimental impact of hydrogen on negative bias temperature instabilities in HfO2-based pMOSFETsProceedings paper