Low-frequency noise assessment of the oxide trap density in thick-oxide input-output transistors for DRAM applications

Simoen, EddyEddySimoenRitzenthaler, RomainRomainRitzenthalerCho, Moon JuMoon JuChoSchram, TomTomSchramHoriguchi, NaotoNaotoHoriguchiAoulaiche, MarcMarcAoulaicheSpessot, AlessioAlessioSpessotFazan, PierrePierreFazanClaeys, CorCorClaeys2021-10-232021-10-2320162162-8769https://imec-publications.be/handle/20.500.12860/27321Low-frequency noise assessment of the oxide trap density in thick-oxide input-output transistors for DRAM applicationsJournal articlehttp://jss.ecsdl.org/content/5/6/N27.abstract