Lukyanchikova, N.N.LukyanchikovaGarbar, N.N.GarbarKudina, V.V.KudinaSmolanka, A.A.SmolankaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19345Investigation of tri-gate FinFETs by noise methodsBook chapter