Poliakov, PavelPavelPoliakovBlomme, PieterPieterBlommeMiranda Corbalan, MiguelMiguelMiranda CorbalanAnchlia, AnkurAnkurAnchliaDobrovolny, PetrPetrDobrovolnyBrusamarello, LucasLucasBrusamarelloStucchi, MicheleMicheleStucchiVan Houdt, JanJanVan HoudtDehaene, WimWimDehaene2021-10-182021-10-182010-03https://imec-publications.be/handle/20.500.12860/17816Impact of line edge roughness on cell-to-cell coupling variability in NAND flash arraysProceedings paper