A new method to calculate leakage current and its applications for sub-45nm MOSFETs

Lujan, GuilhermeGuilhermeLujanMagnus, WimWimMagnusSoree, BartBartSoreePourghaderi, Mohammad AliMohammad AliPourghaderiVeloso, AnabelaAnabelaVelosoVan Dal, MarkMarkVan DalLauwers, AnneAnneLauwersKubicek, StefanStefanKubicekDe Gendt, StefanStefanDe GendtHeyns, MarcMarcHeynsDe Meyer, KristinKristinDe Meyer2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10808A new method to calculate leakage current and its applications for sub-45nm MOSFETsProceedings paper