Menozzi, R.R.MenozziBorgarino, M.M.BorgarinoCova, P.P.CovaBaeyens, YvesYvesBaeyensFantini, F.F.Fantini2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1345The effect of hot electron stress on the DC and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTsJournal article