Using multisines to measure state-of-the-art analog to digital converters

Rabijns, DaanDaanRabijnsVan Moer, WendyWendyVan MoerVandersteen, GerdGerdVandersteenSchoukens, JohanJohanSchoukens2021-10-162021-10-162005-05https://imec-publications.be/handle/20.500.12860/11070Using multisines to measure state-of-the-art analog to digital convertersProceedings paper