Houssa, MichelMichelHoussaVandewalle, N.N.VandewalleNigam, TanyaTanyaNigamAusloos, M.M.AusloosMertens, PaulPaulMertensHeyns, MarcMarcHeyns2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2644Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdownProceedings paper