Statistical model for MOSFET bias temperature instability component due to charge trapping

Wirth, GilsonGilsonWirthda Silva, RobertoRobertoda SilvaKaczer, BenBenKaczer2021-10-192021-10-1920110018-9383https://imec-publications.be/handle/20.500.12860/20154Statistical model for MOSFET bias temperature instability component due to charge trappingJournal article