Gomes, OliverOliverGomesHantschel, ThomasThomasHantschelPierre, E.E.PierreVandervorst, WilfriedWilfriedVandervorst2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23864Investigation of nanoscopic controlled material removal by doped diamond tips for semiconductor device analysisOral presentationhttp://www.dgm.de/dgm/friction_wear/images/finalprogramme.pdf