Grasser, T.T.GrasserRott, K.K.RottReisinger, H.H.ReisingerWaltl, M.M.WaltlSchanovsky, F.F.SchanovskyKaczer, BenBenKaczer2021-10-222021-10-2220140018-9383https://imec-publications.be/handle/20.500.12860/23880NBTI in nanoscale MOSFETs – The ultimate modeling menchmarkJournal articlehttp://dx.doi.org/10.1109/TED.2014.2353578