Chen, ZhuoZhuoChenRonchi, NicoloNicoloRonchiIzmailov, RomanRomanIzmailovTang, HongweiHongweiTangPopovici, Mihaela IoanaMihaela IoanaPopoviciDekkers, HaroldHaroldDekkersPavel, AlexandruAlexandruPavelBosch, Geert Van denGeert Van denBoschRosmeulen, MaartenMaartenRosmeulenAfanas'Ev, Valeri V.Valeri V.Afanas'EvVan Houdt, JanJanVan Houdt2025-03-312025-03-3120252168-6734WOS:001450583000004https://imec-publications.be/handle/20.500.12860/45462Understanding the Slow Erase Operation in IGZO-Channel FeFETs: The Role of Positive Charge Generation KineticsJournal article10.1109/JEDS.2025.3541418WOS:001450583000004MEMORY CHARACTERISTICS