Xu, BlairBlairXuHantschel, ThomasThomasHantschelTsigkourakos, MenelaosMenelaosTsigkourakosVandervorst, WilfriedWilfriedVandervorst2021-10-232021-10-232015https://imec-publications.be/handle/20.500.12860/26206Scanning spreading resistance microscopy for electrical characterization of diamond interfacial layersOral presentation